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X-RAY DIFFRACTION STUDY OF THE THERMAL EXPANSION OF ANTIFERROMAGNETIC MnTe

N. P. GRAZHDANKINA and D. I. GURFEL'

Institute of Metal Physics, Academy of Sciences, U.S.S.R.

Submitted to JETP editor May 10, 1958

J. Exptl. Theoret. Phys. (U.S.S.R.) 35, 907-910 (October, 1958)

Abstract

The variation of the critical lattice parameters of manganese telluride in the vicinity of the antiferromagnetic transition point was investigated by x-ray diffraction. A hypothesis concerning the magnetic structure of MnTe is advanced on the basis of the data obtained. The Neel point TN= 310°K was determined from the anomalous variation of the thermal expansion coefficient, and the dependence of TN on hydrostatic pressure was determined.

http://jetp.ac.ru/cgi-bin/dn/e_008_04_0631.pdf

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